表面测量仪器
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MarSurf VD 140 / 280 计算机式粗糙度测量单元

  • Depending on the measuring task, either the BFW roughness probe system for surface roughness or the C 11 contour probe system for contour measurements can be changed by the operator (hot-plug capable). The new system offers the advantages of combining the highly dynamic C 11 contour probe system with the high-precision BFW probe system, which is particularly suitable for fine surfaces. The new measuring station concept combines speed, reliability and flexibility.
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